ECAD Testing Methodology

The ECAD System 2005 measures and calculates lumped electrical parameters. The distributed character of the circuit under test is acquired and displayed on the time domain reflectometer signature. The system can also characterize voltage vs. current action of an ionization or fission neutron detector. The ECAD System 2005 will measure and calculate all factors relating to insulation quality, including Polarization Ratio, Dissipation factor, Quality Factor, and Insulation Resistance.

The test is controlled by the PC, thereby eliminating human error. Measurements are precise and repeatable.

To negate the contribution of the test lead, ECAD measures the electrical characteristics of the test lead prior to testing the electrical circuit, and uses this set of stored measurements to eliminate the contribution of the test lead. This ensures compatibility of data acquired using different test leads.

The ECAD System 2005 is built around a collection of PCI cards. Rated to switch up to 2500 VDC, the PCI-3300 Switch Card connects different instruments to the circuit under test. The built-in PCI-3400 Multimeter card can measure both DC and AC Voltage, along with DC Resistance. Impedance and Phase Angle measurements are taken with the PCi-3200 impedance card, while an optional Megohmmeter can source up to 1100 VDC for Insulation Resistance Measurements.

Depending on the selected test configuration, the total test time varies from 45 seconds to 11 minutes. (The longer time periods are required for calculation of IEEE Polarization Ratio/Polarization Index/Dielectric Absorption Ratio

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