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CM Technologies carries an unparalleled line of products for testing of
electrical circuits. Beyond simple wire testing, PC-based instrumentation
embodied into our line of wire test systems provides the capability to
completely characterize wiring system condition and performance through a
single-ended, nondestructive measurement.
A brief overview of ECAD® Test Systems:
 | Applicable to Baselining, Troubleshooting and Condition-Based testing
regimen. |
| Acquires and analyzes basic electrical properties of cables and circuits |
| May be used for general purpose test. |
| Programmable for system specific test. |
| Distributed impedance signatures unique to each cable via TDR/EDT™. |
Specific conditions, defects and faults can be identified, located and
monitored/trended, to support long-term performance assessments.
| Dead shorts or complete opens |
| Impedance mismatch (e.g. transition of wire types, splices) |
| Moisture intrusion |
| Resistive connections |
| External shunts & grounds |
| Interbundle shunts |
| Signal loss (dbRL) |
| Cut or abraded insulation |
| Heat damaged insulation |
- Time Domain
Reflectometer (TDR)
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High Resolution TDR Cards are available in a PCMCIA
form factor.
Handheld TDRs
are now available.
- ECAD System 2005
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ECAD® System 2005 consists of a suite of test instruments that acquire
both lumped and distributed data, thereby taking a snapshot of an
electrical circuit. This snapshot can be used for trending analysis
and basic circuit monitoring.
- Impedance Card
- A digital impedance card that can calculate impedance, inductance,
capacitance, quality and dissipation factors at a variety of frequencies,
available in the PCI form factor.
- Switch Card
- The Switch Card enables different instruments to be connected to the
test lead. With elaborate safety checks, the switch card is designed
to ensure the safety of both the user and the circuit.
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